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Data supporting "A new parafocusing paradigm for X-ray diffraction"
dataset
posted on 2020-12-09, 10:07 authored by Danae Prokopiou, James McGovern, Gareth Davies, Simon GodberSimon Godber, Keith RogersKeith Rogers, Paul Evans, Anthony DickenA new approach to parafocusing X-ray diffraction implemented with an annular incident
beam is demonstrated for the first time. The method exploits an elliptical specimen
path on a flat sample to produce relatively high intensity maxima that can be measured
with a point detector. It is shown that the flat-specimen approximation tolerated
by conventional Bragg–Brentano geometries is not required. A theoretical framework,
simulations and experimental results for both angular- and energy-dispersive measurement
modes are presented and the scattering signatures compared with data obtained with
a conventional pencil-beam arrangement.